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Silicon wafer surface film

Silicon wafer surface film, Total:81 items.

In the international standard classification, Silicon wafer surface film involves: Testing of metals, Piezoelectric and dielectric devices, Semiconducting materials, Insulating fluids, Analytical chemistry, Rubber and plastics products, Organic chemicals, Products of non-ferrous metals, Audio, video and audiovisual engineering, Non-ferrous metals, Resistors, Equipment for petroleum and natural gas industries, Surface treatment and coating, Plastics, Construction materials, Non-metalliferous minerals, Optics and optical measurements, Packaging materials and accessories.


國家市場監(jiān)督管理總局、中國國家標準化管理委員會, Silicon wafer surface film

  • GB/T 40279-2021 Test method for thickness of films on silicon wafer surface—Optical reflection method
  • GB/T 40110-2021 Surface chemical analysis—Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
  • GB/T 19921-2018 Test method for particles on polished silicon wafer surfaces
  • GB/T 40933-2021 Plastics—Film and sheeting—Guidance on the testing of thermoplastic films

Group Standards of the People's Republic of China, Silicon wafer surface film

Defense Logistics Agency, Silicon wafer surface film

American Society for Testing and Materials (ASTM), Silicon wafer surface film

  • ASTM F1618-96 Standard Practice for Determination of Uniformity of Thin Films on Silicon Wafers

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, Silicon wafer surface film

  • GB/T 6616-1995 Test method for measuring resistivity of semiconductor silicon or sheet resistance of semiconductor films with a noncontact eddy-current gage
  • GB/T 25188-2010 Thickness measurements for ultrathin silicon oxide layers on silicon wafers X-ray photoelectron spectroscopy
  • GB/T 6616-2009 Test methods for measuring resistivity of semiconductor wafers or sheet resistance of semiconductor films with a noncontact eddy-current gauge
  • GB/T 29505-2013 Test method for measuring surface roughness on planar surfaces of silicon wafer
  • GB/T 6621-2009 Testing methods for surface flatness of silicon slices
  • GB/T 22586-2008 Measurements of surface resistance of high temperature superconductor thin films at microwave frequencies
  • GB/T 19921-2005 Test method of particles on silicon wafer surfaces
  • GB/T 42789-2023 Test method for surface gloss of silicon wafer
  • GB/T 6621-1995 Test methods for surface flatness of silicon polished slices

AR-IRAM, Silicon wafer surface film

ES-AENOR, Silicon wafer surface film

Indonesia Standards, Silicon wafer surface film

Korean Agency for Technology and Standards (KATS), Silicon wafer surface film

International Organization for Standardization (ISO), Silicon wafer surface film

German Institute for Standardization, Silicon wafer surface film

  • DIN ISO 8296:2006 Plastics - Film and sheeting - Determination of wetting tension (ISO 8296:2003)

未注明發(fā)布機構, Silicon wafer surface film

  • DIN ISO 8296:2008 Plastics Film and sheeting -Determination of wetting tension (ISO 8296:2003)

British Standards Institution (BSI), Silicon wafer surface film

  • BS ISO 8296:2003 Plastics - Film and sheeting - Determination of wetting tension
  • BS ISO 13424:2013 Surface chemical analysis. X-ray photoelectron spectroscopy. Reporting of results of thin-film analysis
  • BS ISO 17555:2021 Plastics. Film and sheeting. Biaxially oriented polypropylene (PP) films
  • BS 5806:1979 Method of measurement of thickness for mica blocks, thins, films and splittings

中華人民共和國國家質量監(jiān)督檢驗檢疫總局、中國國家標準化管理委員會, Silicon wafer surface film

  • GB/T 33051-2016 Optical functional films—Superficial hardening film—Determination of thickness of hardening coating
  • GB/T 33398-2016 Optical functional films—Polyethylene terephthalate(PET) film—Determination of surface resistance

Professional Standard - Non-ferrous Metal, Silicon wafer surface film

  • YS/T 719-2009 Flat magneting sputtering target.Silicon target for optical coating

KR-KS, Silicon wafer surface film

中國有色金屬工業(yè)總公司, Silicon wafer surface film

  • YS/T 25-1992 Silicon polishing wafer surface cleaning method

Professional Standard - Radio Television Film, Silicon wafer surface film

IPC - Association Connecting Electronics Industries, Silicon wafer surface film

GSO, Silicon wafer surface film

SCC, Silicon wafer surface film

AENOR, Silicon wafer surface film

  • UNE 55501:1990 SURFACE ACTIVE AGENTS. DETERMINATION OF SURFACE TENSION BY DRAWING UP LIQUID FILMS.
  • UNE 55708:1984 SURFACE ACTIVE AGENTS. DETERMINATION OF INTERFACIAL TENSION BY DRAWING UP LIQUID FILMS

ECIA - Electronic Components Industry Association, Silicon wafer surface film

  • IS-34-1987 Leaded Surface Mount Resistor Networks Fixed Film

International Federation of Trucks and Engines, Silicon wafer surface film

Danish Standards Foundation, Silicon wafer surface film

  • DS/ISO 17555:2021 Plastics – Film and sheeting – Biaxially oriented polypropylene (PP) films

Japanese Industrial Standards Committee (JISC), Silicon wafer surface film

Professional Standard - Chemical Industry, Silicon wafer surface film

  • HG/T 4303-2012 Test method of resistance to abrasion for hard-coating polyester film

Professional Standard - Aviation, Silicon wafer surface film

Association Francaise de Normalisation, Silicon wafer surface film

  • NF T54-199:1999 Plastics - Films and sheets made of polymers for industrial purposes - Light transmission reduction ratio measurement of a pigmented film or sheet


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