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Semiconductor equipment ground resistance

Semiconductor equipment ground resistance, Total:98 items.

In the international standard classification, Semiconductor equipment ground resistance involves: Electromechanical components for electronic and telecommunications equipment, Testing of metals, Semiconducting materials, Shipbuilding and marine structures in general, Aircraft and space vehicles in general, Semiconductor devices, Insulating fluids, Measurement of force, weight and pressure, Printed circuits and boards, Switchgear and controlgear, Electricity. Magnetism. Electrical and magnetic measurements, Rectifiers. Convertors. Stabilized power supply, Capacitors, Telecommunication terminal equipment, Power transmission and distribution networks, Telecommunication systems, Optoelectronics. Laser equipment, Vocabularies, Medical equipment, Installations in buildings.


General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, Semiconductor equipment ground resistance

  • GB/T 15872-1995 Power supply interface for semiconductor equipment
  • GB/T 15872-2013 Power supply interface for semiconductor equipment
  • GB/T 6616-2023 Non-contact eddy current method for testing semiconductor wafer resistivity and semiconductor film sheet resistance
  • GB/T 22193-2008 Electrical installations in ships. Equipment. Semiconductor convertors
  • GB/T 6616-1995 Test method for measuring resistivity of semiconductor silicon or sheet resistance of semiconductor films with a noncontact eddy-current gage
  • GB/T 28030-2011 Earth continuity tester
  • GB/T 6616-2009 Test methods for measuring resistivity of semiconductor wafers or sheet resistance of semiconductor films with a noncontact eddy-current gauge
  • GB 10292-1988 Semiconductor rectifier equipments for telecommunicat-ions

CZ-CSN, Semiconductor equipment ground resistance

  • CSN 35 8737-1975 Semiconductor devices. Diodes. Measurement of differential rosistanoe
  • CSN 35 8773-1977 Meaaurement of semiconductor devices. Thyristors. Meaaurement of blocking current and reverse blocking current.
  • CSN 35 8720 Cast.1-1987 Semiconductor devices. Dimensions
  • CSN 34 0415-1973 Screwless terminals for connecting copper of eonductors
  • CSN IEC 748-4:1994 Semiconductor devices.Integrated circuits.Part 4:Interface integrated circuits
  • CSN 35 8742-1973 Semiconductor devices. Transistors. Measurement of cut-oíf currents
  • CSN IEC 92-304:1993 Electrical installations in ships. Equipment. Semiconductor convertors
  • CSN 35 8762-1973 Semiconductor devices. Phototransistors photodiodes. Measurement of dark current
  • CSN IEC 748-1:1993 Semiconductor devices. Integrated circuits. Part 1: General
  • CSN 35 8761-1973 Semiconductor devices. Phototransistors photodíodes. Measurement of photoelectric current
  • CSN 35 8754-1973 Semiconductor devices. Transistors. Measurement of short-circuit output admittance

SE-SIS, Semiconductor equipment ground resistance

SCC, Semiconductor equipment ground resistance

  • 12/30258683 DC BS EN 62779-1. Semiconductor devices. Semiconductor interface for human body communication. General requirements
  • BS 4417:1969 Specification for semiconductor rectifier equipments
  • DANSK DS/IEC 60092-304 ED4:2022 Electrical installations in ships – Part 304: Equipment – Semiconductor converters
  • BS IEC 60092-304:1980 Electrical installation in ships-Equipment. Semiconductor convertors
  • IEC 60748-4:1987/AMD1:1991 Amendment 1 - Semiconductor devices. Integrated circuits. Part 4: Interface integrated circuits.
  • UNE 20460-5-54:1990 ELECTRICAL INSTALLATIONS OF BUILDINGS. SELECTION AND ERECTION OF ELECTRICAL EQUIPMENT. EARTHING ARRANGEMENTS AND PROTECTIVE CONDUCTORS

Professional Standard - Electron, Semiconductor equipment ground resistance

  • SJ/T 11487-2015 Non-contact measurement method for the resistivity of semi-insulating semiconductor wafer

NEMA - National Electrical Manufacturers Association, Semiconductor equipment ground resistance

  • NEMA RI 6-1959 ELECTROCHEMICAL PROCESSING SEMICONDUCTOR RECTIFIER EQUIPMENT

Defense Logistics Agency, Semiconductor equipment ground resistance

Association Francaise de Normalisation, Semiconductor equipment ground resistance

  • NF C96-779-2*NF EN 62779-2:2016 Semiconductor devices - Semiconductor interface for human body communication - Part 2 : characterization of interfacing performances
  • NF EN 62779-1:2016 Dispositifs à semiconducteurs - Interface à semiconducteurs pour les communications via le corps humain - Partie 1 : exigences générales
  • NF C63-244-1*NF EN IEC 63244-1:2021 Semiconductor devices - Semiconductor devices for wireless power transfer and charging - Part 1 : general requirements and specifications
  • NF C96-005-5*NF EN IEC 60747-5-5:2020 Semiconductor devices - Part 5-5 : optoelectronic devices - Photocouplers

BE-NBN, Semiconductor equipment ground resistance

European Committee for Electrotechnical Standardization(CENELEC), Semiconductor equipment ground resistance

  • EN 62779-2:2016 Semiconductor devices - Semiconductor interface for human body communication - Part 2: Characterization of interfacing performances
  • EN 62047-19:2013 Semiconductor devices - Micro-electromechanical devices - Part 19: Electronic compasses
  • EN IEC 63244-1:2021 Semiconductor devices - Semiconductor devices for wireless power transfer and charging - Part 1: General requirements and specifications
  • EN 62047-20:2014 Semiconductor devices - Micro-electromechanical devices - Part 20: Gyroscopes
  • FprEN IEC 60947-4-3:2020 Low-voltage switchgear and controlgear - Part 4-3: Contactors and motor-starters - Semiconductor controllers and semiconductor contactors for non-motor loads
  • EN IEC 62969-3:2018 Semiconductor devices - Semiconductor interface for automotive vehicles - Part 3: Shock driven piezoelectric energy harvesting for automotive vehicle sensors
  • EN 62047-5:2012 Semiconductor devices - Micro-electromechanical devices - Part 5: RF MEMS switches
  • EN 62047-5:2011 Semiconductor devices - Micro-electromechanical devices - Part 5: RF MEMS switches
  • EN 62047-4:2010 Semiconductor devices - Micro-electromechanical devices - Part 4: Generic specification for MEMS

British Standards Institution (BSI), Semiconductor equipment ground resistance

  • BS IEC 60747-14-3:2009 Semiconductor devices - Semiconductor sensors - Pressure sensors
  • BS 5424-2:1987 Low-voltage controlgear - Specification for semiconductor contactors (solid state contactors)
  • BS EN 60747-15:2012 Semiconductor devices. Discrete devices. Isolated power semiconductor devices
  • BS IEC 60092-304:2022 Electrical installations in ships. Equipment. Semiconductor converters
  • BS IEC 60092-304:2002 Electrical installation in ships - Equipment - Semiconductor convertors
  • BS IEC 62951-9:2022 Semiconductor devices. Flexible and stretchable semiconductor devices - Performance testing methods of one transistor and one resistor (1T1R) resistive memory cells
  • BS IEC 62951-6:2019 Semiconductor devices. Flexible and stretchable semiconductor devices - Test method for sheet resistance of flexible conducting films
  • 18/30383448 DC BS EN 60947-4-3. Low-voltage switchgear and controlgear. Part 4-3. Contactors and motor-starters. Semiconductor controllers and semiconductor contactors for non-motor loads
  • 18/30375223 DC BS EN 60947-4-3. Low-voltage switchgear and controlgear. Part 4-3. Contactors and motor-starters. Semiconductor controllers and semiconductor contactors for non-motor loads
  • BS IEC 60747-8-4:2004 Discrete semiconductor devices - Metal-oxide semiconductor field-effect transistors (MOSFETs) for power switching applications

German Institute for Standardization, Semiconductor equipment ground resistance

  • DIN 50447:1995 Testing of materials for semiconductor technology - Contactless determination of the electrical sheet resistance of semiconductor layers with the eddy-current method
  • DIN 50448:1998 Testing of materials for semiconductor technology - Contactless determination of the electrical resistivity of semi-insulating semi-conductor slices using a capacitive probe
  • DIN 50445:1992 Testing of materials for semiconductor technology; contactless determination of the electrical resistivity of semiconductor slices with the eddy current method; homogeneously doped semiconductor wafers

Korean Agency for Technology and Standards (KATS), Semiconductor equipment ground resistance

RO-ASRO, Semiconductor equipment ground resistance

  • STAS 6271-1981 Ground nets for telecommimication installations ELECTRIC RESISTANCE Spet-ifications
  • STAS 10432-1976 EARTHING DEVICES Methods for measuring the dissipation resistance of the earth plate and the earth resistivity
  • STAS 6693/2-1975 Semiconductor devices TRANSISTORS Methods for measuring electrical properties
  • STAS 6360-1974 SEMICONDUCTOR MATERIALS AND DEVICES Terminology

Danish Standards Foundation, Semiconductor equipment ground resistance

  • DS/EN 62047-19:2013 Semiconductor devices - Micro-electromechanical devices - Part 19: Electronic compasses
  • DS/EN 62047-5:2011 Semiconductor devices - Micro-electromechanical devices - Part 5: RF MEMS switches
  • DS/EN 62047-4:2010 Semiconductor devices - Micro-electromechanical devices - Part 4: Generic specification for MEMS

Professional Standard - Machinery, Semiconductor equipment ground resistance

IECQ - IEC: Quality Assessment System for Electronic Components, Semiconductor equipment ground resistance

  • PQC 82-1989 Semiconductors for Use in Electronic Equipment: Sectional Specification: Semiconductor Integrated Circuits Excluding Hybrid Circuits

International Electrotechnical Commission (IEC), Semiconductor equipment ground resistance

  • IEC 60947-4-3:2020 Low-voltage switchgear and controlgear - Part 4-3: Contactors and motor-starters - Semiconductor controllers and semiconductor contactors for non-motor loads
  • IEC 63244-1:2021 Semiconductor devices - Semiconductor devices for wireless power transfer and charging - Part 1: General requirements and specifications
  • IEC 60747-5-6:2021 Semiconductor devices - Part 5-6: Optoelectronic devices - Light emitting diodes
  • IEC 60747-5-7:2016 Semiconductor devices - Part 5-7: Optoelectronic devices - Photodiodes and phototransistors
  • IEC 60747-5-6:2016 Semiconductor devices - Part 5-6: Optoelectronic devices - Light emitting diodes

National Metrological Verification Regulations of the People's Republic of China, Semiconductor equipment ground resistance

Group Standards of the People's Republic of China, Semiconductor equipment ground resistance

未注明發布機構, Semiconductor equipment ground resistance

YU-JUS, Semiconductor equipment ground resistance

HU-MSZT, Semiconductor equipment ground resistance

  • MSZ 4851/2-1973 Touch Protection Reviews Measuring Ground Resistance and Specific Soil Resistance Power Supply Current Electronic Equipment
  • MNOSZ 18739-1955 Touch Protection Reviews Measuring Ground Resistance and Specific Soil Resistance Power Supply Current Electronic Equipment

Taiwan Provincial Standard of the People's Republic of China, Semiconductor equipment ground resistance

  • CNS 11900-1987 Fixed Ceramic Capacitors for Electronic Equipment (Semiconductor)

Professional Standard - Post and Telecommunication, Semiconductor equipment ground resistance

  • YD/T 940-1999 Semiconductor arrester for The over-voltage protection of telecommunications installations
  • YD 576-1992 Semiconductor rectifier equipments For telecommunications

AENOR, Semiconductor equipment ground resistance

Professional Standard - Electricity, Semiconductor equipment ground resistance

  • DL/T 2553-2022 Technical Guidelines for Measurement of Soil Resistivity, Ground Impedance and Surface Potential in Power Grounding Systems
  • DL/T 1852-2018 Testing regulations for power frequency grounding resistance measuring equipment

Aeronautical Radio Inc., Semiconductor equipment ground resistance

Standard Association of Australia (SAA), Semiconductor equipment ground resistance

  • AS 1852.521:1988 International electrotechnical vocabulary - Semiconductor devices and integrated circuits

Professional Standard - Medicine, Semiconductor equipment ground resistance

AT-ON, Semiconductor equipment ground resistance

RU-GOST R, Semiconductor equipment ground resistance

  • GOST 18986.11-1984 Semiconductor diodes. Total series equivalent resistance measurement methods
  • GOST R 50571.5.54-2013 Low-voltage electrical installations. Part 5-54. Selection and erection of electrical equipment. Earthing arrangements, protective conductors and protective bonding conductors

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