共找到 150 條與 Raman spectroscopy 相關的標準，共 10 頁
Wavenumber calibration is an important part of Raman analysis. The calibration of a Raman spectrometer is performed or checked
Standard Guide for Raman Shift Standards for Spectrometer Calibration
本文件指定了表征石墨烯粉末和液體分散體中單層 flakes、雙層石墨烯和石墨烯納米片的結構特性的方法序列。所述屬性包括層數/厚度、橫向片尺寸、無序水平、層對齊和比表面積。給出了從粉末和分散體表征石墨烯的建議測量協議、樣品制備程序和數據分析方法
Nanotechnologies - Structural characterization of graphene - Part 1: Graphene from powders and dispersions
This document specifies the sequence of methods for characterizing the structural properties of graphene, bilayer graphene and graphene nanoplatelets
Nanotechnologies. Structural characterization of graphene. Graphene from powders and dispersions
To define capabilities and limitations of Raman spectroscopy as it pertains to counterfeit detection of EEE parts and suggest possible applications
Techniques for Suspect/Counterfeit EEE Parts Detection by Raman Spectroscopy Test Methods
This document defines terms for surface chemical analysis in the area of optical interface analysis including ellipsometry, Raman spectroscopy
Surface chemical analysis — Vocabulary — Part 3: Terms used in optical interface analysis
New experimental technique for real-time corrosion monitoring
本文件定義了用于光學界面分析的表面化學分析術語，包括橢偏光譜學、拉曼光譜學和非線性光學技術以及通用光學術語
Surface chemical analysis. Vocabulary - Terms used in optical interface analysis
This part of IEC 62607 establishes a standardized method to determine the structural key control characteristic strain uniformity for single-layer
Nanomanufacturing - Key control characteristics - Part 6-6: Graphene - Strain uniformity: Raman spectroscopy
本文件規定了表征粉末和液相分散石墨烯、雙層石墨烯和石墨烯納米片的結構特性的方法序列，通常在基底上分離出單個薄片之后使用多種測量技術。表征的特性包括層數/厚度、橫向薄片尺寸、無序水平、層對齊和比表面積。提供了建議的測量協議、樣品制備程序和數據分析，用于從粉末和分散液中表征石墨烯
Nanotechnologies - Structural characterization of graphene - Part 1: Graphene from powders and dispersions
本部分IEC TS 62607建立了一種標準化方法，通過結合原子力顯微鏡、光學透射和拉曼光譜，確定石墨烯薄片的關鍵控制特性——層數
Nanomanufacturing - Key control characteristics - Part 6-2: Graphene - Number of layers: atomic force microscopy, optical transmission, Raman spectroscopy
本部分 IEC TS 62607 建立了一種標準化方法，用于通過拉曼光譜和光學反射確定石墨烯薄膜的關鍵控制特性——層數。確定層數的標準是 G 峰積分強度和光學對比度。這兩種方法可以區分石墨烯和多層石墨烯，但單獨使用或組合使用都無法在所有情況下（特別是所有可能的堆疊角度）確定層數。然而，通過比較兩
Nanomanufacturing - Key Control Characteristics - Part 6-12: Graphene - Number of layers: Raman spectroscopy, optical reflection
1.1 Forensic paint analyses and comparisons are typically distinguished by sample size that precludes the application of many standard industrial
Standard Guide for Forensic Paint Analysis and Comparison
本標準為評估石墨烯及相關產品的橫向片徑、平均片厚、拉曼光譜中D峰與G峰強度比以及碳氧比例提供了測量方法指導。包括原子力顯微鏡、拉曼光譜和X射線光電子能譜等技術。將通過實例說明每種測量類型。 本指南旨在為制造商、生產者、分析人員以及其他對石墨烯及其相關產品（如氧化石墨烯和還原氧化石墨烯）感興趣的人士
Standard Guide for Characterization of Graphene Flakes
1.1 This standard will provide guidance on the measurement approaches for assessment of lateral flake size, average flake thickness, Raman intensity
Standard Guide for Characterization of Graphene Flakes
6.1 This guide is designed to assist the forensic paint examiner in selecting and organizing
Standard Guide for Forensic Paint Analysis and Comparison
