Selected Area Electron Diffraction Peaks

Selected Area Electron Diffraction Peaks, Total:16 items.

In the international standard classification, Selected Area Electron Diffraction Peaks involves: Optical equipment, Optics and optical measurements, Analytical chemistry, Vocabularies.

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, Selected Area Electron Diffraction Peaks

• GB/T 18907-2002 Method of selected area electron diffraction for transmission electron microscopes
• GB/T 18907-2013 Microbeam analysis.Analytical electron microscopy.Selected-area electron diffraction analysis using a transmission electron microscope
• GB/T 19501-2004 General guide for electron backscatter diffraction analysis

International Organization for Standardization (ISO), Selected Area Electron Diffraction Peaks

• ISO/CD 25498:2023 Microbeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscope
• ISO/DIS 25498:2024 Microbeam analysis-Analytical electron microscopy-Selected area electron diffraction analysis using a transmission electron microscope
• ISO/CD 23699 Microbeam Analysis — Electron Backscattered Electron Diffraction — Vocabulary
• ISO 25498:2010 Microbeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope
• ISO 25498:2018 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope

British Standards Institution (BSI), Selected Area Electron Diffraction Peaks

• BS ISO 25498:2018 Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope
• 24/30479937 DC BS ISO 25498 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope
• BS ISO 25498:2010 Microbeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope

GSO, Selected Area Electron Diffraction Peaks

• BH GSO ISO 25498:2017 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
• OS GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
• GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope

United States Navy, Selected Area Electron Diffraction Peaks

• NAVY UFGS-01 33 29-2010 LEED(TM) DOCUMENTATION

Association Francaise de Normalisation, Selected Area Electron Diffraction Peaks

• NF T25-111-6:1991 Carbon fibres- Texture and structure- Part 6: Analysis of the selected area diffraction

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