DIN 50450-1:1987-08
半導體技術材料測試;載氣和摻雜氣體中雜質的測定;五氧化二磷電池測定水中氫、氧、氮、氬、氦中的雜質
Testing of materials for semiconductor technology; determination of impurities in carrier gases and doping gases; determination of water impurity in hydrogen, oxygen, nitrogen, argon and helium by using a diphosphorus pentoxide cell