DIN 50450-1:1987
半導體工藝材料的檢驗.載運氣體和添加劑氣體中雜質的測定.用五氧化二磷電池測定氫、氧、氮、氬和氦中的水雜質
Testing of materials for semiconductor technology; determination of impurities in carrier gases and doping gases; determination of water impurity in hydrogen, oxygen, nitrogen, argon and helium by using a diphosphorus pentoxide cell